- Silicon dislocations and Si3N4 inclusions
From the feedstock to the wafer, Silicon material represents a very important share of a PV module cost.
In order to increase the number of appropriate feedstock sources and to end up with the best possible use of each material, information will be exchanged on :
- key criteria and specifications for Silicon material,
- characterisation techniques of impurities, crystal defects and additional relevant parameters,
- impact on Si solar cell performances
Research activities are carried out on this "Silicon material" topic. The Research Infrastructures offering access to external research projects are listed in the table hereunder:
(click to open the PDF file)
Partner | Research Infrastructures | Main Characteristics |
|---|---|---|
CEA-INES | <media 110 - external-link-new-window "APPLICATION, Sophia RI description CEA INES Susi 02, Sophia_RI_description_CEA_INES_Susi_02.pdf, 31 KB">Susi</media> | Crucible coating equipment, crystallisation furnaces (10, 60 and 600kg), ingot and wafer characterisation (electronic and chemical, with ppb resolution) |
ECN | <media 195>Characterisation Lab</media> | Electrical and optical characterisation of wafers and solar cells, in-line imaging |
ENEA | <media 144 - - "APPLICATION, Sophia RI description Si Material c Si ENEA - new, Sophia_RI_description_Si_Material_cSi_ENEA_-_new.pdf, 210 KB">High efficiency cSi solar cells</media> | All steps from wafer to solar cell processing |
ENEA | <media 145 - - "APPLICATION, Sophia RI description Si Material c Si for CPV ENEA - new, Sophia_RI_description_Si_Material_cSi_for_CPV_ENEA_-_new.pdf, 267 KB">Si cell for CPV</media> | Processing and characterisation of material and devices |
Fraunhofer ISE | <media 190 - - "APPLICATION, Sophia RI description Si Material Wafer Cell Imaging ISE, Sophia_RI_description_Si_Material_Wafer_Cell_Imaging_ISE.pdf, 55 KB">Wafer & Cell Imaging</media> | Electrical and optical characterisation of silicon materials and solar cells, understanding of impurities and crystal defects |
IMEC | <media 125 - - "APPLICATION, Sophia RI description Si material IMEC, Sophia_RI_description_Si_material_IMEC.pdf, 98 KB">Cell modelling infrastructure</media> | Electrical and optical characterisation of wafers, nano-characterisation, FE modelling of thermomechanical effects and stresses |
Sintef | <media 142 - - "APPLICATION, Sophia RI description Si material SINTEF Heliosi Characterization, Sophia_RI_description_Si_material_SINTEF_Heliosi_Characterization.pdf, 233 KB">Heliosi Characterisation</media> | Electronic and structural properties, chemical composition |
Sintef | <media 143 - - "APPLICATION, Sophia RI description Si Material SINTEF Heliosi Crystallization, Sophia_RI_description_Si_Material_SINTEF_Heliosi_Crystallization.pdf, 333 KB">Heliosi Crystallisation</media> | Crystallisation furnaces of 12 and 150 kg Czochralski furnaces up to 5" - 135 kg |
- Silicon block lifetime measurement
If you would like to be listed here, as an additional research infrastructure provider (even outside this consortium), please contact us.
