- Electroluminescence on a CIGS module
For some specific applications, thin films represents an alternative to the Silicon-based technologies and their market share may increase in the future.
Previous benchmarking has shown that specific issues come along with thin films :
- Characterisation methods of the multiple layers and interfaces, in order to improve material understanding and to develop in-line control tools and defect analysis
- Development of pre-conditioning procedures to more accurately measure the efficiency
- Analysis of stabilities and metastabilities
Five Research Infrastructures propose an access on this topic:
(click to open the PDF file)
Partner | Research Infrastructures | Main Characteristics | |
|---|---|---|---|
ENEA | <media 146 - - "APPLICATION, Sophia RI description Thin Films TCO ENEA, Sophia_RI_description_Thin_Films_TCO__ENEA.pdf, 437 KB">TCO sputter - MOCVD deposition </media> | LP-MOCVD and plasma treatment on 30x30 cm², characterisation | |
HZB | <media 117 - - "APPLICATION, Sophia RI description Thin Films CISSY, Sophia_RI_description_Thin_Films_CISSY.pdf, 183 KB">Cissy</media> | UHV-end station for preparation and analysis of PV thin films | |
HZB | <media 150>EPR characterisation</media> | Electron Paramagnetic Resonance for defects and impurities characterisation | |
HZB | <media 130 - - "APPLICATION, Sophia RI Thin Films HZB TCO sputtering, Sophia_RI_Thin_Films_HZB_TCO_sputtering.pdf, 25 KB">TCO sputter deposition</media> | TCO layer deposition and characterisation on substrates from 5x5 to 30x30 cm². | |
JRC | <media 131 - - "APPLICATION, Sophia RI Description Thin Films JRC, Sophia_RI_Description_Thin_Films_JRC.pdf, 29 KB">Thin film characterisation</media> | Thin film PV module characterisation : calibration, improved test methods |
